Microfocus X-Ray Fluoroscopy System

  • Further Improved Operability
  • Remodeled windows and an enlarged display with a simple, user-friendly layout ensure the intended operation is performed without guesswork.
SKU: Microfocus X-Ray Fluoroscopy System Categories: ,
  • Taking Innovation to New Heights with Shimadzu X-Ray Inspection Systems
  • The SMX-1000 Plus and SMX-1000L Plus X-ray inspection systems are a further refinement of their popular predecessors, the SMX-1000 and SMX-1000L, which have become the benchmarks of the industry.
  • The operability so well received in earlier models has been further improved, resulting in much simpler and easier-to-see windows.
  • The enlarged fluoroscopic exterior image view provides a new level of visibility.
  • The measurement functions are so much easier to use that results can now be obtained with just a click, and require no complicated

Parameter Settings.


  • New functions such as enhanced region-of-interest display have been incorporated, complementing a wealth of conventional functions including navigation via exterior images, step feed, teaching, and image browsing.

Application


  • Both the SMX-1000 Plus and SMX-1000L Plus provide high-magnification nondestructive fluoroscopic examinations of junction conditions (disconnect, contact) of ultra-micro parts on high-density PCBs, BGAs, CSPs, or system LSIs.

Clear Images


  • As with earlier models, the combination of flat panel detector with Shimadzu image processing technology leads to clear, distortion-free images.

Inclined Fluoroscopy


  • The flat panel detector with a tilt angle of up to 60° enables fluoroscopy over an extensive range while maintaining constant magnification, so defects that are undetectable with vertical fluoroscopy can be detected.

Easy Measurements


  • Troublesome measurement parameter settings are automatically optimized, and thanks to our proprietary image-processing technology, measurement results are now obtained with simple mouse operations.